C-V Analyzer Semiconductor Parameter Testing System, 1kHz-2MHz, 2 Channels, for Diode and Transistor Testing

The TH511 Semiconductor C-V Analyzer is designed in response to current trends in semiconductor power device development, specifically tailored for analyzing semiconductor materials and power devices. The instrument adopts an integrated design, enabling one-click testing of parasitic capacitance and C-V characteristics for various semiconductor power devices such as diodes, transistors, MOSFETs, and IGBTs—without the need for frequent cable switching or parameter adjustments. Both discrete power devices and power modules can be tested quickly with a single click, making it suitable for production line rapid testing and automated integration. Its C-V curve scanning and analysis capabilities also meet the requirements for R&D and characterization of semiconductor materials and power devices in laboratory settings. With a frequency range of 1kHz–2MHz, a VGS voltage of up to ±40V, and VDS voltages of ±200V, ±1500V, or ±3000V, the instrument is well-equipped to handle the testing demands of most power devices.

• All-In-One Testing: Highly integrated, compact, and efficient. Integrates LCR meter, VGS/VDS voltage sources, and a high/low-voltage switching matrix with PC software, all controlled through a capacitive touch-enabled Linux interface for simplified operation
• 10.1-Inch Display：One-Touch Measurement for Ciss, Coss, Crss, Rg and Cies, Coes, Cres, Rg; 10.1-inch display simultaneously shows test results, equivalent circuit diagrams, and sorting data for instant analysis
• List Testing: The semiconductor C-V analyzer supports parallel testing of up to 6 discrete devices, 6-core devices, or 6 module devices simultaneously. All measured parameters are displayed with test results and judgment outcomes in list scan mode
• Supports C-V characteristic curve analysis: Both logarithmic and linear scanning modes. It enables simultaneous display of multiple curves，includes Multiple curves of the same parameter under different Vg biases, Multiple parameters under the same Vg bias
• Integrates Dual DC Power Supplies: Enabling comprehensive C-V characterization of diodes. Its Cs-V function facilitates junction capacitance measurements and C-V analysis for various diode types